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Published on: October 1, 2007
Position offsets in curved-channel microchannel plate detectors
Applied Optics
|August 14, 2010
Summary
Curved-channel microchannel plates (C plates) used in ultraviolet (UV) and extreme-ultraviolet (EUV) observations can cause image distortions. This study quantifies and calibrates these distortions, improving detector accuracy for high-resolution imaging and spectroscopy.
Area of Science:
- Astrophysics
- Optical Engineering
- Detector Physics
Background:
- Microchannel plate detectors are crucial for ultraviolet (UV) and extreme-ultraviolet (EUV) observations.
- Curved-channel microchannel plates (C plates) offer high electron gain but introduce spatial or spectral distortions due to channel offsets.
Purpose of the Study:
- To investigate and quantify image distortions in C plates caused by non-constant channel curvature.
- To improve the accuracy of detectors used in high-resolution imaging and spectroscopy.
Main Methods:
- Observing spectral nonlinearities in an EUV spectrometer.
- Measuring input and output positions of plugged channels in C plates.
- Mapping input versus output using a scanned UV light spot.
Main Results:
- A typical C plate with 25-microm pores exhibits +/-25-microm image distortion.
- Calibration of distortion improved spectral line positions by a factor of 4.
- Enabled solar-emission-line Doppler shift determination to +/-2 microm (+/-1 km/s).
Conclusions:
- Non-constant channel curvature in C plates causes significant image distortion.
- Calibration of these distortions is essential for accurate high-resolution EUV/UV measurements.
- This work enhances the utility of C plates for precise astrophysical observations.
