Synchrotron-based scattered radiation from phantom materials used in X-ray CT

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Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
08:46

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

Published on: April 13, 2016

Donepudi V Rao1, Medasani Swapna, Roberto Cesareo

  • 1Istituto di Matematica e Fisica, Università degli Studi di Sassari, Sassari, Italy. donepudi_venkateswararao@rediffmail.com

Journal of X-Ray Science and Technology
|August 18, 2010
PubMed

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