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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.

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Related Experiment Video

Updated: Jun 10, 2026

Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser
09:00

Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser

Published on: June 28, 2018

Angular scanning mechanism for ellipsometers.

D M Byrne, D L Macfarlane

    Applied Optics
    |August 19, 2010
    PubMed
    Summary
    This summary is machine-generated.

    A novel elliptical mirror design simplifies ellipsometer instrumentation for precise angular measurements. This innovation enhances the determination of differential angular measurements of ellipsometric parameters.

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    Published on: July 26, 2016

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    Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser
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    Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces
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    Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces

    Published on: July 26, 2016

    Area of Science:

    • Optical Physics
    • Instrumentation Science

    Background:

    • Ellipsometry is a powerful optical technique for characterizing thin films and surfaces.
    • Traditional ellipsometers often require complex mechanical setups for variable angle measurements.

    Purpose of the Study:

    • To introduce an elliptical mirror configuration for ellipsometers.
    • To enable variable angle measurements at a fixed instrument position.
    • To simplify the mechanical design of ellipsometers.

    Main Methods:

    • Implementation of a specifically designed elliptical mirror.
    • Integration into an ellipsometer setup.
    • Utilizing the mirror for fixed-position, variable-angle beam alignment.

    Main Results:

    • Reduced mechanical complexity in the ellipsometer.
    • Achieved variable angle beam alignment with a fixed optical setup.
    • Enabled accurate determination of differential angular measurements of ellipsometric parameters.

    Conclusions:

    • The elliptical mirror offers a more mechanically straightforward approach to ellipsometry.
    • This configuration facilitates precise optical measurements.
    • The method is suitable for advanced thin film and surface analysis.