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Updated: Jun 10, 2026

Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
Published on: May 27, 2008
X-ray phase contrast microscopy at 300 nm resolution with laboratory sources
Daniele Pelliccia1, Andrea Sorrentino, Inna Bukreeva
1School of Physics, Monash University, Clayton, Victoria 3800, Australia. daniele.pelliccia@sci.monash.edu.au
Abstract:
We report the performance of an X-ray phase contrast microscope for laboratory sources with 300 nm spatial resolution. The microscope is based on a commercial X-ray microfocus source equipped with a planar X-ray waveguide able to produce a sub-micrometer x-ray beam in one dimension. Phase contrast images of representative samples are reported. The achieved contrast and resolution is discussed for different configurations. The proposed approach could represent a simple, inexpensive, solution for sub-micrometer resolution imaging with small laboratory setups.
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