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$Interference and Diffraction$ 02:18

Interference and Diffraction

Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.

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There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...

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Related Experiment Video

Updated: Jun 10, 2026

Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

OPD measurement and dispersion reduction in a monolithic interferometer.

Brian Hicks¹, Timothy Cook, Benjamin Lane

¹Center for Space Physics, Boston University, 725 Commonwealth Avenue, Boston, MA 02215, USA. bahicks@bu.edu

|August 20, 2010

Summary

We developed a method to precisely measure and correct optical path differences in nulling interferometers, improving their ability to image exoplanets. This significantly enhances the performance of instruments used for direct imaging of nearby planetary systems.

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Last Updated: Jun 10, 2026

Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

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Published on: August 12, 2013

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

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Published on: April 1, 2020

Area of Science:

* Astronomy and Astrophysics
* Optical Engineering
* Exoplanet Detection

Background:

* Monolithic nulling interferometers are crucial for direct imaging of exoplanets and circumstellar environments.
* Optical path difference (OPD) between interferometer arms can impair performance in broadband light.
* Compensator plates are used to reduce OPD, but their differential thicknesses require precise measurement.

Purpose of the Study:

* To present a white light fringe scanning and pupil bisecting method for measuring OPD in a monolithic nulling interferometer.
* To determine differential thicknesses of compensator plates for OPD correction.
* To improve the nulling bandpass and overall performance of the interferometer for exoplanet imaging.

Main Methods:

* Employed a white light fringe scanning technique.
* Utilized a pupil bisecting method for OPD measurement.
* Applied the measurements to correct optically contacted compensator plates.

Main Results:

* Reduced the initial optical path difference from 949+/-44 nm to 63+/-10 nm.
* The correction significantly improved the interferometer's performance.
* Achieved a 25% R-band nulling bandpass, a substantial increase from monochromatic.

Conclusions:

* The developed method accurately measures and corrects OPD in nulling interferometers.
* This technique is vital for enhancing direct imaging capabilities of exoplanets.
* Optimized interferometers enable more effective characterization of planetary companions and stellar environments.