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Generation and Coherent Control of Pulsed Quantum Frequency Combs
06:42

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Published on: June 8, 2018

Self-referenced characterization of optical frequency combs and arbitrary waveforms using a simple, linear,

V R Supradeepa1, Christopher M Long, Daniel E Leaird

  • 1School of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907, USA. supradeepa@purdue.edu

Optics Express
|August 20, 2010
PubMed
Summary

We present a simple spectral shearing interferometry method for characterizing optical frequency combs and arbitrary waveforms. This technique accurately measures amplitude, phase, and fiber dispersion using minimal equipment, even at low power levels.

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Area of Science:

  • Optics and Photonics
  • Waveform Characterization
  • Interferometry

Background:

  • Characterizing optical frequency combs and arbitrary waveforms is crucial for advanced optical systems.
  • Existing methods can be complex or require specialized equipment.
  • Accurate amplitude and phase information is essential for metrology and communications.

Purpose of the Study:

  • To introduce a simple, linear, zero-delay spectral shearing interferometry technique.
  • To enable robust amplitude and phase characterization of optical frequency comb sources.
  • To demonstrate measurement of dispersion and dispersion slope in long fiber lengths.

Main Methods:

  • Implementation of spectral shearing interferometry with an intensity modulator and optical spectrum analyzer.
  • Characterization of two high repetition rate (approx. 10 GHz) frequency comb sources.
  • Exploitation of long coherence lengths and self-referenced measurements for dispersion analysis.

Main Results:

  • Successful amplitude and phase characterization of two distinct frequency comb sources.
  • Demonstration of the technique's effectiveness at average power levels down to 100 nW.
  • Accurate single-ended measurement of dispersion and dispersion slope in over 25 km of optical fiber.

Conclusions:

  • The developed spectral shearing interferometry is a simple and effective tool for optical waveform characterization.
  • The technique is versatile, applicable to frequency combs and dispersion measurements.
  • Its low power requirement and ease of implementation make it suitable for various applications.