One-dimensional hard x-ray field retrieval using a moveable structure

Area of Science:

• Optics and Photonics
• X-ray Optics
• Metrology

Background:

• Accurate characterization of hard x-ray beams is crucial for various applications, including medical imaging and materials science.
• Traditional methods like knife-edge scans require direct measurement at the focal plane, which can be challenging for narrow beams.

Purpose of the Study:

• To develop and validate a novel technique for measuring the field of an x-ray line focus.
• To enable characterization of narrower x-ray beams than previously possible.

Main Methods:

• Utilizing one-dimensional phase retrieval with transverse translation diversity.
• Employing far-field intensity measurements exclusively, avoiding direct focal plane measurements.
• Reconstructing the hard x-ray beam profile focused by a compound kinoform lens.

Main Results:

• The developed technique successfully recovered the hard x-ray beam profile.
• Reconstructed beam profiles showed good agreement with independent knife-edge scan measurements.
• The method demonstrated the capability to measure narrower beams effectively.

Conclusions:

• The proposed technique offers a non-invasive and accurate method for hard x-ray beam characterization.
• This approach overcomes limitations of traditional methods, particularly for narrow beam measurements.
• The technique has potential implications for advancing x-ray optics and metrology.