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Related Experiment Video

Updated: Jun 10, 2026

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
11:42

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities

Published on: July 24, 2015

Boron nitride substrates for high-quality graphene electronics.

C R Dean1, A F Young, I Meric

  • 1Department of Electrical Engineering, Columbia University, New York, New York 10027, USA. cdean@cisl.columbia.edu

Nature Nanotechnology
|August 24, 2010
PubMed
Summary
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High-quality graphene devices were fabricated on hexagonal boron nitride (h-BN) substrates. This new method significantly improves graphene device performance compared to traditional silicon dioxide substrates.

Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Nanotechnology

Background:

  • Graphene devices on silicon dioxide (SiO2) substrates exhibit poor performance due to disorder.
  • Suspended graphene offers improved quality but limits device design.
  • A need exists for high-quality, substrate-supported graphene devices.

Purpose of the Study:

  • To fabricate and characterize high-quality graphene devices on hexagonal boron nitride (h-BN) substrates.
  • To evaluate the performance of graphene on h-BN compared to graphene on SiO2.
  • To explore the potential of h-BN as a superior dielectric substrate for graphene.

Main Methods:

  • Mechanical transfer of exfoliated mono- and bilayer graphene onto single-crystal h-BN substrates.
  • Fabrication of graphene devices on h-BN.

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Preparation of Carbon Nanosheets at Room Temperature
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Last Updated: Jun 10, 2026

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
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Published on: July 24, 2015

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  • Characterization of device properties, including mobility and carrier inhomogeneity.
  • Main Results:

    • Graphene devices on h-BN exhibited mobilities and carrier inhomogeneities nearly an order of magnitude better than those on SiO2.
    • Devices showed reduced surface roughness, intrinsic doping, and chemical reactivity.
    • The fabrication process demonstrated the potential for controlled assembly of layered materials.

    Conclusions:

    • Hexagonal boron nitride (h-BN) is a promising dielectric substrate for high-performance graphene devices.
    • The mechanical transfer method enables the fabrication of advanced graphene heterostructures.
    • This approach paves the way for realizing complex graphene-based electronic devices.