Bit error rate of optical logic: fan-in, threshold, and contrast

Area of Science:

• Optoelectronics
• Quantum Information Science
• Digital Communications

Background:

• Shot noise significantly impacts the performance of direct detection optical logic devices.
• Understanding device parameters like fan-in, contrast ratio, and light output is crucial for optimizing performance.
• Direct detection and intensity modulation are key techniques in optical communication systems.

Purpose of the Study:

• To calculate bit error rates in threshold optical logic devices considering shot noise.
• To derive optimal device thresholds for minimizing bit error rates.
• To investigate the fundamental quantum limits on device reliability.

Main Methods:

• Calculation of bit error rates under shot noise conditions.
• Derivation of expressions for optimal device thresholds based on device parameters.
• Analysis of the fundamental quantum limit on reliability.

Main Results:

• Expressions for optimal device thresholds were derived for given device parameters.
• The fundamental quantum limit on reliability was examined.
• A bound sufficient for high-probability correct system operation was established.

Conclusions:

• Optimal device thresholds can be determined to minimize bit error rates in the presence of shot noise.
• The study provides insights into the fundamental limits of reliability in optical logic devices.
• The derived reliability bound ensures high-probability system operation.