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Updated: Jun 9, 2026

Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures
Published on: November 21, 2019
Dielectric tensor characterization for magneto-optical recording media
Abstract:
A new and comprehensive dielectric-tensor characterization method was used for the characterization of magneto-optical recording media. The effect of film thickness and bilayer thickness on the magneto-optic Kerr effect was studied for a series of Co-Pd samples. The composition dependencies of the dielectric tensor for both Co-Pt and Co-Pd superlattice samples were measured, and the enhancement of the magneto-optical Kerr effect for these samples was studied.
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