Contouring by electronic speckle pattern interferometry with quadruple-beam illumination

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Conducting Multiple Imaging Modes with One Fluorescence Microscope
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Y Zou, H Diao, X Peng

    Applied Optics
    |August 25, 2010
    PubMed

    Abstract:

    We present a new arrangement for contouring by electronic speckle pattern interferometry with four illumination beams, thereby making it unnecessary to move anything during the.

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