Contouring by electronic speckle pattern interferometry with quadruple-beam illumination
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Conducting Multiple Imaging Modes with One Fluorescence Microscope
Published on: October 28, 2018
Applied Optics
|August 25, 2010
Abstract:
We present a new arrangement for contouring by electronic speckle pattern interferometry with four illumination beams, thereby making it unnecessary to move anything during the.

