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Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
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Related Experiment Video

Updated: Jun 9, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
10:39

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Published on: October 11, 2016

Three-dimensional speckle measurements with a diffraction grating.

R Henao, F Medina, H J Rabal

    Applied Optics
    |August 31, 2010
    PubMed
    Summary
    This summary is machine-generated.

    A novel speckle technique measures 3D displacements by incorporating a diffraction grating into the Burch setup. This method enhances optical metrology for precise motion analysis.

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    Last Updated: Jun 9, 2026

    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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    Published on: October 11, 2016

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    Area of Science:

    • Optical Metrology
    • Experimental Physics
    • Materials Science

    Background:

    • Accurate measurement of three-dimensional (3D) displacements is crucial in various scientific and engineering fields.
    • Classical optical methods like the Burch setup are effective for bidimensional measurements but lack 3D capabilities.

    Purpose of the Study:

    • To propose and describe a novel method for measuring 3D displacements.
    • To adapt the Burch experimental setup for 3D displacement measurements using speckle techniques.

    Main Methods:

    • The proposed method integrates a diffraction grating into the classical bidimensional Burch experimental setup.
    • Speckle pattern analysis is employed to determine displacement components.

    Main Results:

    • The modified Burch setup successfully enables the measurement of three-dimensional displacements.
    • Experimental validation demonstrates the feasibility and accuracy of the proposed technique.

    Conclusions:

    • The integration of a diffraction grating provides a viable extension of the Burch setup for 3D displacement metrology.
    • This enhanced speckle technique offers a valuable tool for precise motion analysis in scientific research and industrial applications.