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Related Concept Videos

Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...

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Related Experiment Video

Updated: Jun 9, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Diffraction imaging in a He+ ion beam scanning transmission microscope.

John Notte1, Raymond Hill, Sean M McVey

  • 1Carl Zeiss SMT Inc, One Corporation Way, Peabody, MA 01960, USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 1, 2010
PubMed
Summary

Scanning transmission helium ion microscopy demonstrates feasibility for imaging crystalline materials. This technique provides nanometer resolution and high contrast images of defects, even at low energies.

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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Last Updated: Jun 9, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Area of Science:

  • Materials Science
  • Microscopy
  • Physics

Background:

  • The scanning helium ion microscope (SHIM) offers potential for advanced materials characterization.
  • Investigating its capabilities in transmission mode is crucial for understanding its utility.

Purpose of the Study:

  • To assess the feasibility of using SHIM in transmission mode.
  • To evaluate the signal content and image information obtained from crystalline materials.
  • To determine the utility of SHIM for imaging crystal defects.

Main Methods:

  • Utilized a scanning helium ion microscope operating at 40 keV in transmission mode.
  • Employed Monte Carlo modeling to predict ion beam penetration and imaging resolution.
  • Analyzed bright-field and annular dark-field signals for contrast.
  • Observed diffraction effects, including thickness fringes and dislocation images.

Main Results:

  • Achieved good agreement between experimental results and Monte Carlo predictions for beam penetration and resolution in MgO crystals.
  • Observed anticipated contrasts in bright-field and annular dark-field imaging, related to beam absorption and scattering.
  • Demonstrated crystallographic contrast effects, such as thickness fringes and dislocation images, due to He ion beam diffraction.

Conclusions:

  • Scanning transmission helium ion microscopy is a feasible technique for materials analysis.
  • The method provides nanometer-scale resolution and high-contrast imaging of crystalline materials and defects.
  • Useful sample penetration and detailed crystallographic information can be obtained even at modest beam energies.