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Updated: Jun 9, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
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Note: Multiscale scanning probe microscopy

L Chassagne1, S Blaize, P Ruaux

  • 1Laboratoire d'Ingénierie des Systèmes, Université de Versailles Saint-Quentin, 45 Avenue des Etats Unis, 78035 Versailles, France. luc.chassagne@uvsq.fr

The Review of Scientific Instruments
|September 7, 2010
PubMed

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