An x-ray photoelectron spectra and atomic force microscopy characterization of silica substrates engineered with a

Antonino Gulino1, Guglielmo G Condorelli, Placido Mineo

  • 1Dipartimento di Scienze Chimiche, Università di Catania and INSTM UdR of Catania, Viale Andrea Doria 6, 95125 Catania, Italy.

Nanotechnology
|September 7, 2010
PubMed

Related Concept Videos