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12:14
The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
Published on: August 12, 2013
Improved technique for measuring full-field absolute phases in a common-path heterodyne interferometer
1Department of Photonics and Institute of Electro-Optical Engineering, National Chiao-Tung University,1001 Ta-Hsueh Road, Hsinchu 30010, Taiwan.
Applied Optics
|September 8, 2010
Summary
This study introduces a new method for precise phase determination in electro-optic modulators using asymmetric triangle voltage signals. The technique enables accurate full-field absolute phase measurements for improved optical system analysis.
Area of Science:
- Optoelectronics
- Signal Processing
- Optical Measurement
Background:
- Electro-optic modulators are crucial components in optical systems.
- Accurate phase measurement is essential for many optoelectronic applications.
- Existing phase determination methods may have limitations in accuracy or scope.
Purpose of the Study:
- To develop an improved method for determining absolute phase in electro-optic modulators.
- To enable full-field absolute phase measurements across all pixels.
- To demonstrate the validity and effectiveness of the proposed technique.
Main Methods:
- Applying an asymmetric triangle voltage signal to drive the electro-optic modulator.
- Obtaining interference signals with two groups of periodic sinusoidal segments at different frequencies.
- Fitting these segments to determine their associated phases.
- Calculating absolute phase by subtracting the initial phase.
Main Results:
- Successfully determined the phases of the two sinusoidal segment groups.
- Achieved absolute phase calculation by incorporating initial phase information.
- Demonstrated the applicability of the method to all pixels for full-field measurements.
- Validated the accuracy and reliability of the proposed phase measurement technique.
Conclusions:
- The improved method provides accurate absolute phase determination for electro-optic modulators.
- Full-field absolute phase measurement is achievable, enhancing optical system characterization.
- This technique offers a robust solution for phase measurement challenges in optoelectronics.
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