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Updated: Jun 9, 2026

Preparation of Macroporous Epitaxial Quartz Films on Silicon by Chemical Solution Deposition
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Determination of the refractive index of a-Si(1-x)C(x):H thin films from infrared absorption spectra

S Lugomer, A Maksimović, D Gracin

    Applied Optics
    |September 8, 2010
    PubMed

    Keywords:
    refractive index measurementthin film characterizationinfrared absorption analysisamorphous silicon-carbon films

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