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Related Concept Videos

Interference and Diffraction02:18

Interference and Diffraction

Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.
Interference and Superposition of Waves01:07

Interference and Superposition of Waves

When two waves of the same nature occur in the same region simultaneously, they result in interference. Interference of waves implies that the net effect of the waves is the sum of the individual waves' effects. However, it does not imply that the individual waves affect the propagation of other waves.
Interference occurs in mechanical waves, such as sound waves, waves on a string, and surface water waves. Mechanical waves correspond to the physical displacement of particles. Hence,...
Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.

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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Published on: October 11, 2016

Wave diffraction by many superposed volume gratings.

K Y Tu, T Tamir

    Applied Optics
    |September 11, 2010
    PubMed
    Summary
    This summary is machine-generated.

    This study extends multiple-scattering theory for wave diffraction by multiple gratings. The flow graph approach efficiently calculates diffraction intensity, revealing phase sensitivity in grating structures.

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    Area of Science:

    • Optics and Photonics
    • Computational Physics

    Background:

    • Wave diffraction is fundamental in optics.
    • Previous methods struggled with complex, multi-grating systems.

    Purpose of the Study:

    • To extend multiple-scattering theory for wave diffraction by an arbitrary number of superposed gratings.
    • To develop an efficient computational method for analyzing diffraction patterns.

    Main Methods:

    • Developed a flow graph representation for the multiple-scattering diffraction process.
    • Implemented algorithms for calculating diffraction intensities of any order.
    • Investigated phase effects using two example grating structures.

    Main Results:

    • The flow graph approach allows for memory-efficient calculation of diffraction intensities.
    • Demonstrated that the method can identify grating structures sensitive to relative phase.

    Conclusions:

    • The extended multiple-scattering technique provides an efficient and versatile tool for analyzing complex diffraction phenomena.
    • Understanding phase sensitivity is crucial for designing advanced optical grating devices.