Photodiode nonlinearity measurement with an intensity stabilized laser as a radiation source

A new facility for the nonlinearity measurement of the spectral responsivity of photodiodes has been developed by using an intensity stabilized laser as radiation source. This device enables an automated measurement of the photodiode nonlinearity from the nanowatt to the milliwatt radiant power range at wavelengths between 250 and 800 nm with uncertainties of better than 0.01% in the visible and better than 0.05% in the UV at the 1σ level.