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Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.

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Related Experiment Video

Updated: Jun 8, 2026

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

Intracavity transmission ellipsometry for optically anisotropic components.

W Holzapfel, S Neuschaefer-Rube, U Neuschaefer-Rube

    Applied Optics
    |September 22, 2010
    PubMed
    Summary

    Intracavity ellipsometry precisely measures optical component properties like retardation and orientation. This technique, using a phase-modulated laser, shows feasibility for analyzing optically anisotropic materials.

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    Area of Science:

    • Optics and Photonics
    • Laser Physics
    • Materials Science

    Background:

    • Traditional ellipsometry methods can be complex and time-consuming.
    • Accurate characterization of optical components is crucial for various applications.
    • Optical anisotropy affects light propagation and polarization.

    Purpose of the Study:

    • To introduce and validate intracavity ellipsometry for optical component characterization.
    • To demonstrate the feasibility and precision of measuring relative retardation (Δ) and main axis orientation (φ).
    • To explore the potential for measuring polarization-dependent loss angle (Ψ) and rotation angles (ρ).

    Main Methods:

    • Placing the optical component within a phase-modulated continuous-wave (cw) laser cavity.
    • Monitoring changes in beat frequency, beam polarization, and intensity.
    • Utilizing a diode-pumped Neodymium-doped Yttrium Aluminum Garnet (Nd:YAG) laser ellipsometer.

    Main Results:

    • Preliminary measurements successfully determined relative retardation (Δ) and main axis orientation (φ).
    • Demonstrated the feasibility and precision of the intracavity ellipsometry technique.
    • Indicated the potential for comprehensive characterization of optical properties.

    Conclusions:

    • Intracavity ellipsometry offers a precise and feasible method for measuring optical component parameters.
    • The technique is particularly promising for analyzing optically anisotropic components.
    • Further development could extend its capability to measure additional polarization-dependent properties.