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Atomic Absorption Spectroscopy: Radiation and Light Sources

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Related Experiment Video

Updated: Jun 8, 2026

Measurements of Soil Carbon by Neutron-Gamma Analysis in Static and Scanning Modes

Measurements of Soil Carbon by Neutron-Gamma Analysis in Static and Scanning Modes

Published on: August 24, 2017

Schwarzschild microscope for carbon Kα radiation.

K Murakami, T Oshino, H Nakamura

|September 22, 2010

Summary

Researchers developed a new Schwarzschild objective with multilayer mirrors for carbon Kα radiation, achieving high-resolution imaging. This advancement enables < 0.5 µm resolution for advanced microscopy applications.

Area of Science:

Optics and Photonics
Materials Science
X-ray Microscopy

Background:

High-resolution imaging is crucial for scientific discovery.
Developing advanced optical components is essential for pushing imaging limits.

Purpose of the Study:

To design and fabricate a Schwarzschild objective for high-resolution imaging.
To develop novel multilayer mirrors for carbon Kα radiation.

Main Methods:

Designed and fabricated a Schwarzschild objective with ×32 magnification and 0.2 numerical aperture.
Developed NiCr/C multilayer mirrors using ion-beam sputtering with corrected thickness distribution.
Utilized an electron impact carbon Kα radiation source for imaging.

Main Results:

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$Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2$

Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2

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Last Updated: Jun 8, 2026

Measurements of Soil Carbon by Neutron-Gamma Analysis in Static and Scanning Modes

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Preparation of Carbon Nanosheets at Room Temperature

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$Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2$

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Achieved a resolution of 0.1 µm within 30 µm of object height with the objective.
Confirmed a resolution of < 0.5 µm in magnified images.
Demonstrated the effectiveness of the developed multilayer mirrors.

Conclusions:

The fabricated Schwarzschild objective and novel multilayer mirrors enable high-resolution X-ray microscopy.
This technology advances imaging capabilities for nanoscale applications.