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Related Concept Videos

Confocal Fluorescence Microscopy01:16

Confocal Fluorescence Microscopy

Confocal microscopy is an advanced microscopic technique. The prime advantage of the confocal microscope over other microscopy techniques is its ability to block the out-of-focus light from the illuminated samples using pinholes. It is widely used with fluorescence optics to obtain high-resolution, sharp contrast images. Unlike optical microscopes, confocal microscopes use a focused beam of light laser to scan the entire sample surface at different z-planes. These microscopes are, therefore,...
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Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...

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Related Experiment Video

Updated: Jun 8, 2026

Three-dimensional Super Resolution Microscopy of F-actin Filaments by Interferometric PhotoActivated Localization Microscopy (iPALM)
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Extended-focus phase imaging with an interferometric confocal microscope.

R D Holmes, M G Somekh

    Applied Optics
    |September 24, 2010
    PubMed
    Summary
    This summary is machine-generated.

    Extended-focus phase imaging uses a modified interferometer to measure topographical variations. This new technique significantly increases the depth of field for phase microscopy, enabling detailed scans of tilted samples.

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    Last Updated: Jun 8, 2026

    Three-dimensional Super Resolution Microscopy of F-actin Filaments by Interferometric PhotoActivated Localization Microscopy (iPALM)
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    Area of Science:

    • Optical microscopy
    • Phase imaging
    • Surface metrology

    Background:

    • Confocal microscopy utilizes extended-focus imaging for enhanced depth.
    • Phase imaging offers high sensitivity to surface topography.
    • Traditional phase microscopes have limited depth of field.

    Purpose of the Study:

    • To introduce and validate a novel extended-focus phase imaging modality.
    • To measure differential phase response on tilted samples with high resolution.
    • To overcome the depth-of-field limitations in phase microscopy.

    Main Methods:

    • Utilized a modified differential interferometer.
    • Developed an extended-focus phase imaging technique.
    • Applied the method to measure phase variations on tilted samples.

    Main Results:

    • Demonstrated high lateral resolution phase scans.
    • Successfully imaged samples with long-range warp and tilt.
    • Achieved an effectively indefinite depth of field for phase imaging.

    Conclusions:

    • Extended-focus phase imaging provides a powerful tool for high-resolution surface topography analysis.
    • The technique overcomes depth-of-field constraints in phase microscopy.
    • This modality is suitable for characterizing samples with complex, large-scale surface features.