Tolerance analysis of cascaded self-electro-optic-effect-device arrays.

Area of Science:

• Optoelectronics
• Optical Computing
• Device Physics

Background:

• Symmetric self-electro-optic-effect devices (SEEDs) are key components in 2D information processing circuits.
• Nonuniformity in device reflectivity and passive optical components can limit circuit performance.
• Understanding these tolerances is essential for designing reliable and efficient optical systems.

Purpose of the Study:

• To determine the tolerable nonuniformity of SEED arrays and passive optical components.
• To establish a method for assessing mutual tolerances in 2D information processing circuits.
• To define the operational parameter space for acceptable circuit function.

Main Methods:

• Development of a method to quantify mutual tolerances between SEEDs and optical components.
• Analysis of parameter space to identify regions of acceptable operation.
• Inclusion of device-to-device leakage in tolerance calculations.

Main Results:

• Quantification of acceptable operational volumes within the circuit's parameter space.
• Identification of specific parameter regimes for adjusted operation post-construction.
• Determination of narrower regimes for achieving high clock and cycle rates.

Conclusions:

• The presented method effectively defines operational tolerances for SEED-based 2D information processing circuits.
• Device leakage significantly impacts achievable clock rates and operational regimes.
• This work provides critical insights for the design and optimization of optical computing systems.