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Noise Characterization of Polycrystalline Silicon Thin Film Transistors for X-ray Imagers Based on Active Pixel

L E Antonuk1, M Koniczek, J McDonald

  • 1Department of Radiation Oncology, University of Michigan, Ann Arbor, MI 48109.

Materials Research Society Symposia Proceedings. Materials Research Society
|September 24, 2010
PubMed

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