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Atomic Nuclei: Nuclear Relaxation Processes

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Updated: Jun 8, 2026

Experimental Methods for Trapping Ions Using Microfabricated Surface Ion Traps

Experimental Methods for Trapping Ions Using Microfabricated Surface Ion Traps

Published on: August 17, 2017

Criticality in trapped atomic systems.

L Pollet¹, N V Prokof'ev, B V Svistunov

¹Physics Department, Harvard University, Cambridge, Massachusetts 02138, USA.

Physical Review Letters

|September 28, 2010

Summary

Accurate critical parameters for second-order phase transitions can be determined from atomic systems. Proper analysis of time-of-flight images, not in situ density profiles, is key for reliable results in strongly correlated regimes.

Area of Science:

Atomic physics
Quantum phase transitions
Statistical mechanics

Background:

Determining critical parameters in atomic systems is crucial for understanding phase transitions.
Trapping potentials can introduce limitations in accurately measuring these parameters.
Previous studies have suggested limitations in current experimental methods.

Purpose of the Study:

To investigate the generic limits imposed by trapping potentials on critical parameter determination.
To deduce optimal protocols for extracting critical parameters accurately.
To evaluate the suitability of in situ density profiles versus time-of-flight imaging for studying critical points.

Main Methods:

Theoretical analysis of trapping potential effects on atomic systems.

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Last Updated: Jun 8, 2026

Experimental Methods for Trapping Ions Using Microfabricated Surface Ion Traps

Experimental Methods for Trapping Ions Using Microfabricated Surface Ion Traps

Published on: August 17, 2017

Cooling an Optically Trapped Ultracold Fermi Gas by Periodical Driving

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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Development of protocols for parameter extraction.

Comparative analysis of in situ density profiles and time-of-flight imaging data.

Main Results:

In situ density profiles are currently insufficient for accurate critical point studies in strongly correlated regimes.
Optimal protocols for parameter extraction were deduced based on identified limitations.
Time-of-flight imaging analysis provides accurate critical parameters, contrary to some recent claims.

Conclusions:

Trapping potentials present challenges for precise critical parameter measurement in atomic systems.
Time-of-flight imaging is a reliable method for obtaining accurate critical parameters, even in strongly correlated systems.
Optimized protocols can enhance the accuracy of phase transition studies in atomic experiments.