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Updated: Jun 8, 2026

10:39
Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Abstract:
A concentric optical design for a grating spectrometer is described. General aberration theory is given for a family of designs of similar form, showing close similarities with the theory for conventional concentric imagers used in microlithography. Control of stray radiation in the concentric grating spectrometer is discussed.
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