Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Properties of Enantiomers and Optical Activity02:24

Properties of Enantiomers and Optical Activity

It is essential to understand the difference between chiral and achiral interactions and the implications thereof in optical activity and their applications. Just as our feet, which are chiral, interact uniquely with chiral objects, such as a pair of shoes, but identically with achiral socks, enantiomers of a molecule exhibit different properties only when they interact with other chiral media. An example of a significant implication from this facet is the phenomenon known as optical activity,...
Measuring Reaction Rates03:09

Measuring Reaction Rates

Polarimetry finds application in chemical kinetics to measure the concentration and reaction kinetics of optically active substances during a chemical reaction. Optically active substances have the capability of rotating the plane of polarization of linearly polarized light passing through them—a feature called optical rotation. Optical activity is attributed to the molecular structure of substances. Normal monochromatic light is unpolarized and possesses oscillations of the electrical field in...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Development of an algorithm for the calculation of the scattering properties of agglomerates.

Applied optics·2010
Same author

High-temperature ellipsometer system to determine the optical properties of materials.

Applied optics·2010
Same author

Role of metal additives in light scattering from flame particulates.

Applied optics·2010
Same author

Sensitivity of the reflection technique: optimum angles of incidence to determine the optical properties of materials.

Applied optics·2010
Same author

Method for azimuthal alignment in fixed-angle ellipsometry.

Applied optics·2010
Same author

Surface-roughness effects on the determination of optical properties of materials by the reflection method.

Applied optics·2010
Same journal

Multifunctional reconfigurable terahertz metasurface based on vanadium dioxide phase transition: achieving broadband absorption and efficient polarization conversion.

Applied optics·2026
Same journal

High-Q-factor electromagnetically induced transparency utilizing quasi-bound states in the continuum in an all-dielectric terahertz metasurface.

Applied optics·2026
Same journal

Automated stitching interferometry for high-precision metrology of X-ray mirrors.

Applied optics·2026
Same journal

Experimental demonstration of an approach to designing a metal-dielectric DBR resonant cavity structure.

Applied optics·2026
Same journal

High-precision wavefront reconstruction from a single-shot interferogram using a physics-driven hybrid feature calibration network.

Applied optics·2026
Same journal

Ultra-high-Q Fano resonance based on coupled topological corner states in Kagome photonic crystals.

Applied optics·2026
See all related articles

Related Experiment Video

Updated: Jun 8, 2026

Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures
08:01

Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures

Published on: November 21, 2019

Source-optics polarization effects on ellipsometry analysis.

B J Stagg, T T Charalampopoulos

    Applied Optics
    |October 2, 2010
    PubMed
    Summary
    This summary is machine-generated.

    Accurate optical properties of bulk samples require accounting for source polarization effects in ellipsometric analysis. Including these effects significantly alters refractive index calculations, especially the imaginary part.

    More Related Videos

    Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
    09:32

    Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

    Published on: January 26, 2016

    Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization
    05:54

    Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization

    Published on: September 8, 2023

    Related Experiment Videos

    Last Updated: Jun 8, 2026

    Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures
    08:01

    Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures

    Published on: November 21, 2019

    Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
    09:32

    Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

    Published on: January 26, 2016

    Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization
    05:54

    Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization

    Published on: September 8, 2023

    Area of Science:

    • Materials Science
    • Optics
    • Spectroscopy

    Background:

    • Ellipsometry is a powerful technique for determining optical properties of materials.
    • Accurate analysis relies on precise modeling of light-sample interactions.
    • Source polarization can introduce systematic errors in ellipsometric measurements.

    Purpose of the Study:

    • To develop analytical expressions for Fourier coefficients including source polarization effects.
    • To enable more accurate inference of optical properties from ellipsometric data.
    • To assess the impact of source polarization on refractive index determination.

    Main Methods:

    • Derivation of general analytical expressions for Fourier coefficients.
    • Application to any ellipsometer system with known source-optics characteristics.
    • Analysis of amorphous carbon sample data using discrete Fourier transform.
    • Comparison of refractive indices with and without source-polarization correction.

    Main Results:

    • The developed expressions are general and applicable without constraints on incidence angle or azimuthal angles.
    • Inclusion of source-optics parameters increased the real part of the refractive index by 1.5%.
    • The imaginary part of the refractive index decreased by up to 12% when source-polarization effects were included.

    Conclusions:

    • Source polarization significantly impacts the inferred optical properties, particularly the imaginary part of the refractive index.
    • Accurate determination of optical constants necessitates the inclusion of source-polarization corrections.
    • The developed method provides a general framework for improving ellipsometric data analysis.