Multiple-plane anisoplanatic phase correction in a laboratory digital holography experiment
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Abbie E Tippie1, James R Fienup
1Institute of Optics, University of Rochester, Rochester, New York 14627, USA. tippie@optics.rochester.edu
Optics Letters
|October 5, 2010
Abstract:
We present results for a digital holography experiment with anisoplanatic image correction through two discrete planes of phase errors. Using a nonlinear optimization technique, we maximize a modified sharpness metric to solve for estimates of the phase errors in the system in the multiple planes where they physically exist. We show that correcting for phase errors in multiple planes gives a superior image to correction in one plane.

