Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Float-polishing process and analysis of float-polished quartz.

Applied optics·2010

Same author

Correlation between substrate preparation technique and scatter observed from optical coatings.

Applied optics·2010

Same author

Etching of high-reflecting thin-film assemblies using ion-beam-figuring techniques.

Optics letters·2009

Same author

Properties of TiO2 and SiO2 thin films deposited using ion assisted deposition.

Applied optics·1985

Search research articles

Related Experiment Video

Updated: Jun 8, 2026

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography

Published on: May 15, 2017

Subsurface damage identification in optically transparent materials using a nondestructive method.

C F Kranenberg, K C Jungling

|October 12, 2010

Summary

This summary is machine-generated.

Total internal reflection microscopy non-destructively images subsurface damage in fused silica. This optical technique differentiates surface and subsurface features using polarization, aiding in-process diagnostics.

More Related Videos

The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight

The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight

Published on: October 11, 2016

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

Related Experiment Videos

Last Updated: Jun 8, 2026

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography

Published on: May 15, 2017

The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight

The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight

Published on: October 11, 2016

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

Area of Science:

Materials Science
Optical Physics
Surface Science

Background:

Subsurface damage in optical materials like fused silica can compromise performance.
Conventional imaging techniques may struggle to differentiate surface from subsurface defects.
Non-destructive evaluation methods are crucial for quality control in optical fabrication.

Purpose of the Study:

To apply total internal reflection microscopy (TIRM) for imaging subsurface damage in fused silica.
To demonstrate TIRM's capability in distinguishing surface from subsurface features.
To validate TIRM as a non-destructive in-process diagnostic tool for optical fabrication.

Main Methods:

Utilized total internal reflection microscopy (TIRM) on conventionally polished fused-silica flats.
Manipulated illuminating polarization to differentiate between surface and subsurface features.
Analyzed intensity distributions within the illuminated region of interest.

Main Results:

Successfully imaged subsurface damage sites in fused silica.
Demonstrated the ability to differentiate surface and subsurface features by altering polarization.
Confirmed the non-destructive nature of the technique, requiring only surface cleaning.

Conclusions:

Total internal reflection microscopy is an effective non-destructive method for subsurface damage assessment in fused silica.
Polarization control in TIRM allows for clear differentiation of surface and subsurface features.
TIRM serves as a valuable in-process diagnostic tool for optical fabrication, enhancing quality control.