Jove
Visualize
Contact Us

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Float-polishing process and analysis of float-polished quartz.

Applied optics·2010
Same author

Correlation between substrate preparation technique and scatter observed from optical coatings.

Applied optics·2010
Same author

Etching of high-reflecting thin-film assemblies using ion-beam-figuring techniques.

Optics letters·2009
Same author

Properties of TiO2 and SiO2 thin films deposited using ion assisted deposition.

Applied optics·1985
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Video

Updated: Jun 8, 2026

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
11:34

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography

Published on: May 15, 2017

Subsurface damage identification in optically transparent materials using a nondestructive method.

C F Kranenberg, K C Jungling

    Applied Optics
    |October 12, 2010
    PubMed
    Summary
    This summary is machine-generated.

    Total internal reflection microscopy non-destructively images subsurface damage in fused silica. This optical technique differentiates surface and subsurface features using polarization, aiding in-process diagnostics.

    More Related Videos

    The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight
    10:27

    The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight

    Published on: October 11, 2016

    Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
    11:47

    Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

    Published on: February 27, 2013

    Related Experiment Videos

    Last Updated: Jun 8, 2026

    Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
    11:34

    Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography

    Published on: May 15, 2017

    The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight
    10:27

    The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight

    Published on: October 11, 2016

    Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
    11:47

    Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

    Published on: February 27, 2013

    Area of Science:

    • Materials Science
    • Optical Physics
    • Surface Science

    Background:

    • Subsurface damage in optical materials like fused silica can compromise performance.
    • Conventional imaging techniques may struggle to differentiate surface from subsurface defects.
    • Non-destructive evaluation methods are crucial for quality control in optical fabrication.

    Purpose of the Study:

    • To apply total internal reflection microscopy (TIRM) for imaging subsurface damage in fused silica.
    • To demonstrate TIRM's capability in distinguishing surface from subsurface features.
    • To validate TIRM as a non-destructive in-process diagnostic tool for optical fabrication.

    Main Methods:

    • Utilized total internal reflection microscopy (TIRM) on conventionally polished fused-silica flats.
    • Manipulated illuminating polarization to differentiate between surface and subsurface features.
    • Analyzed intensity distributions within the illuminated region of interest.

    Main Results:

    • Successfully imaged subsurface damage sites in fused silica.
    • Demonstrated the ability to differentiate surface and subsurface features by altering polarization.
    • Confirmed the non-destructive nature of the technique, requiring only surface cleaning.

    Conclusions:

    • Total internal reflection microscopy is an effective non-destructive method for subsurface damage assessment in fused silica.
    • Polarization control in TIRM allows for clear differentiation of surface and subsurface features.
    • TIRM serves as a valuable in-process diagnostic tool for optical fabrication, enhancing quality control.