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Modulation transfer function measurement of sparse-array sensors using a self-calibrating fringe pattern.

J E Greivenkamp, A E Lowman

    Applied Optics
    |October 12, 2010
    PubMed
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    A new method measures the pixel modulation transfer function (MTF) of sparse-array sensors using a Twyman-Green interferometer. This technique enables self-calibration and accurate MTF assessment at high spatial frequencies.

    Area of Science:

    • Optical engineering
    • Sensor technology
    • Metrology

    Background:

    • Accurate measurement of sensor performance is crucial for imaging systems.
    • Characterizing the modulation transfer function (MTF) reveals spatial resolution limitations.
    • Sparse-array sensors present unique challenges for traditional MTF measurement techniques.

    Purpose of the Study:

    • To develop a simple and self-calibrating method for measuring the pixel modulation transfer function (MTF) of sparse-array sensors.
    • To extend the measurement capability to high spatial frequencies beyond the sensor's sampling limit.
    • To investigate the influence of sensor characteristics on MTF at specific spatial frequencies.

    Main Methods:

    • Utilized a phase-shifting Twyman-Green interferometer to generate precise fringe patterns.

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  • Incident fringe patterns were directed onto the sparse-array sensor, and signal modulation was measured.
  • Employed self-calibration by measuring at multiples of the Nyquist frequency, leveraging unique aliased patterns.

    • Main Results:

    • Successfully measured spatial frequencies up to 480 cycles/mm, exceeding ten times the sensor's sampling frequency.
    • Observed expected MTF shapes at multiples of the sensor's sampling frequency.
    • Identified that electronic bandwidth and crosstalk in charge-injection device (CID) sensors affect MTF at odd multiples of the Nyquist frequency.

    Conclusions:

    • The developed method provides a straightforward and accurate approach for extended MTF measurement of sparse-array sensors.
    • The technique allows for high-frequency characterization, revealing performance limitations beyond the Nyquist frequency.
    • Understanding the impact of electronic bandwidth and crosstalk is essential for optimizing CID sensor performance.