TEK/Tie2 is a novel gene involved in endoplasmic reticulum stress

Endoplasmic reticulum (ER) stress has been implicated in the pathogenesis of diseases such as neurodegenerative disease. In the present study, we established the ER stress–resistant SH-SY5Y cell line, and through microarray analysis, we found that TEK/Tie2 expression is up-regulated in this cell line. Moreover, we found that TEK/Tie2 expression was markedly decreased in ER-stressed cells. The effect was time-dependent (2 – 24 h), which began to decrease from 2-h time point. Our findings suggest that TEK/Tie2 expression is involved in cell survival, whereas when severe ER stress occurs, TEK/Tie2 expression is down-regulated, resulting in cell death.