Updated: Jun 8, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Boris Desiatov1, Ilya Goykhman, Uriel Levy
1Department of Applied Physics, The Benin School of Engineering and Computer Science, The Center for Nanoscience and Nanotechnology, The Hebrew University of Jerusalem, Jerusalem, 91904, Israel.
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We developed submicron silicon waveguides using local oxidation for precise control over dimensions and smooth sidewalls. These waveguides exhibit low loss, crucial for integrated photonics applications.
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