Defect solitons in kagome optical lattices

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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Xing Zhu1, Hong Wang, Li-Xian Zheng

  • 1Guangdong Engineering Research Center for Semiconductor Lighting, School of Science, South China University of Technology, Guangzhou, 510640, China.

Optics Express
|October 14, 2010
PubMed

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