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Oblique incidence and observation electronic speckle-pattern interferometry.

C Joenathan, B Franze, H J Tiziani

|October 14, 2010

Summary

This study introduces an electronic speckle-pattern interferometer using an anamorphic prism for oblique incidence. This setup enables collinear object and reference beams for enhanced interferometric measurements.

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Area of Science:

Optical Engineering
Metrology
Interferometry

Background:

Electronic speckle-pattern interferometry (ESPI) is a non-contact optical measurement technique.
Traditional ESPI setups often require complex optical arrangements for oblique incidence and observation.
Achieving phase stepping in ESPI can enhance measurement accuracy and facilitate quantitative analysis.

Purpose of the Study:

To present a novel electronic speckle-pattern interferometer design.
To utilize an anamorphic prism for oblique incidence and observation.
To introduce a phase-stepping capability for improved measurement.

Main Methods:

An anamorphic prism is integrated into the interferometer setup.
A collimated beam is directed through the prism, with partial reflection forming the reference beam.
Transmitted light illuminates the object, creating the object beam, with both beams being collinear.
A modified scheme using two prisms is proposed for phase stepping.

Main Results:

The proposed design simplifies the optical path by making object and reference beams collinear.
The use of an anamorphic prism facilitates oblique incidence and observation.
A new two-prism scheme enables phase stepping within the interferometer.

Conclusions:

The developed interferometer offers a more straightforward configuration for oblique incidence measurements.
The integration of phase stepping enhances the quantitative capabilities of the system.
This approach advances the application of ESPI in various fields requiring precise surface deformation analysis.