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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

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Related Experiment Video

Updated: Jun 8, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
11:47

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

Microshape and rough-surface analysis by fringe projection.

K Leonhardt, U Droste, H J Tiziani

    Applied Optics
    |October 14, 2010
    PubMed
    Summary
    This summary is machine-generated.

    A novel fringe-projection microscopy system enables detailed 3D surface topography measurements. This advanced technique works for both smooth and rough surfaces, offering high resolution and a wide dynamic range.

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    High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques
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    Published on: December 3, 2013

    Quantitative Hardness Measurement by Instrumented AFM-indentation
    08:21

    Quantitative Hardness Measurement by Instrumented AFM-indentation

    Published on: November 22, 2016

    Related Experiment Videos

    Last Updated: Jun 8, 2026

    Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
    11:47

    Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

    Published on: February 27, 2013

    High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques
    11:34

    High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques

    Published on: December 3, 2013

    Quantitative Hardness Measurement by Instrumented AFM-indentation
    08:21

    Quantitative Hardness Measurement by Instrumented AFM-indentation

    Published on: November 22, 2016

    Area of Science:

    • Optical Metrology
    • Microscopy
    • Surface Science

    Background:

    • Microscopic surface analysis requires advanced imaging techniques.
    • Existing methods may have limitations in measuring diverse surface types or resolution.

    Purpose of the Study:

    • To develop and analyze a fringe-projection system for microscopic applications.
    • To enable high-resolution 3D surface topography measurement of various materials.

    Main Methods:

    • Utilized a single high-aperture objective for both grating projection and fringe imaging.
    • Employed spatial filtering and lateral shifting of the grating spectrum for telecentric projection and imaging.
    • Developed preprocessing steps for analyzing highly rough surfaces.

    Main Results:

    • Successfully measured topographies of both specularly and diffusely reflecting surfaces.
    • Derived and verified formulas for vertical/lateral resolution, measuring range, and dynamic range based on noise analysis.
    • Demonstrated the system's capability on technical surfaces.

    Conclusions:

    • The developed fringe-projecting microscopy system is effective for detailed microscopic surface analysis.
    • The system offers versatile measurement capabilities for different surface types and roughness.
    • Formulas provide a basis for understanding and optimizing system performance.