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A novel method for measuring the vertical birefringence of optical disk substrates
Applied Optics
|October 22, 2010
Summary
A new, simple method measures vertical birefringence on optical disk substrates using a laser and CCD camera. This non-intrusive technique quickly maps birefringence, aiding substrate manufacturing quality control.
Area of Science:
- Optical Physics
- Materials Science
Background:
- Vertical birefringence in optical disk substrates can affect performance.
- Accurate measurement is crucial for quality control in manufacturing.
Purpose of the Study:
- To develop a simple, non-intrusive method for measuring vertical birefringence across the entire surface of optical disk substrates.
Main Methods:
- Utilized a linearly polarized Helium-Neon (He-Ne) laser (1-2 mW) and a computer-interfaced CCD camera.
- The system captures data rapidly for surface birefringence mapping.
Main Results:
- Successfully demonstrated a method for measuring vertical birefringence over the entire substrate surface.
- The process is non-intrusive, easy to set up, and requires only seconds for data acquisition.
Conclusions:
- The described system provides a fast and effective way to map vertical birefringence.
- This technique is a valuable potential quality control tool for optical disk substrate manufacturing.
