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Updated: Jun 7, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Data acquisition and processing system of the electron cyclotron emission imaging system of the KSTAR tokamak

J B Kim1, W Lee, G S Yun

  • 1Department of Physics, POSTECH, San-31, Hyoja-dong, Nam-gu, Pohang, Kyungbuk 790-784, South Korea. jckim@postech.ac.kr

The Review of Scientific Instruments
|November 2, 2010
PubMed

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