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Updated: Jun 7, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
06:46

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

Published on: August 25, 2016

Calculation of the Johann error for spherically bent x-ray imaging crystal spectrometers

E Wang1, P Beiersdorfer, M Gu

  • 1Lawrence Livermore National Laboratory, Livermore, California 94550, USA. wang53@llnl.gov

The Review of Scientific Instruments
|November 2, 2010
PubMed

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