Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
Atomic Emission Spectroscopy: Instrumentation
Mass Spectrometers
Tandem Mass Spectrometry
Atomic Absorption Spectroscopy: Instrumentation
Transmission Electron Microscopy
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
T Iwawaki1, H Habara, T Tanimoto
1Graduate School of Engineering, Osaka University, Yamada-oka, 2-1, Suita, Osaka 565-0871, Japan.
Researchers developed a multichannel electron spectrometer (MCESM) to measure electron energy distributions. This new spectrometer achieved high resolution, enabling detailed analysis of laser-target interactions.
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