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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
Published on: December 2, 2022
Prediction of the bidirectional reflectance-distribution function from atomic-force and scanning-tunneling microscope
Abstract:
Computer codes that are based on Elson's theory for light scattering by interfacial roughness in multilayer coatings were used to predict the bidirectional reflectance-distribution function (BRDF) of several opaque coatings from surface-roughness profiles measured by either a scanning-tunneling microscope or an atomic-force microscope. The predictions usually agreed with measured BRDF values to within a factor of 2. The coatings consisted of single layers of Ag or Ni and dielectric stacks with up to three layers.
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