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Total Internal Reflection Fluorescence Microscopy

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Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces
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Published on: July 26, 2016

Reflection-transmission photoellipsometry: theory and experiments.

G Bader, P V Ashrit, F E Girouard

    Applied Optics
    |November 2, 2010
    PubMed
    Summary
    This summary is machine-generated.

    This study introduces a photoellipsometry method for analyzing multilayer thin films, including thick substrates. The technique accurately characterizes various film types, proving effective for energy-efficient window coatings.

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    Published on: July 21, 2018

    Area of Science:

    • Materials Science
    • Optics
    • Surface Science

    Background:

    • Analyzing multilayer structures with thin films and thick substrates presents challenges.
    • Traditional methods may not fully account for optical effects in semitransparent thick layers.

    Purpose of the Study:

    • To develop and validate a reflection-transmission photoellipsometry method for multilayer thin film analysis.
    • To accurately characterize samples with both thin films and semitransparent thick layers or substrates.

    Main Methods:

    • Utilized reflection and transmission photoellipsometry.
    • Developed a theoretical treatment considering multiple reflections in substrates.
    • Built and tested an automatic reflection-transmission spectroscopic ellipsometer.

    Main Results:

    • Demonstrated the method's effectiveness on samples with strongly absorbing and highly transmitting films on glass substrates.
    • Achieved a good fit between experimental data and theoretical predictions.
    • Validated the photoellipsometric approach for complex multilayer systems.

    Conclusions:

    • The proposed photoellipsometry method is suitable for analyzing thin films on thick substrates.
    • This technique is particularly advantageous for evaluating energy-efficient window coatings.
    • The developed method provides accurate characterization of multilayer optical properties.