Related Experiment Video
Updated: Jun 7, 2026

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
Published on: July 24, 2015
Nanoanalysis of graphene layers using scanning probe techniques
1Cavendish Laboratory, Department of Physics, University of Cambridge, Cambridge CB3 0HE, UK. mrc61@cam.ac.uk
Abstract:
Graphene is an almost ideal two-dimensional system. Unlike other two-dimensional electron gas systems realized in silicon or gallium arsenide, the electron wave functions are very close to the surrounding environment. While this causes problems in trying to passivate the surface without reducing the mobility, it does allow direct electrical access to the two-dimensional surface states using scanning probe techniques. In this review, we look at recent advances in the nanoanalytics of the surface and edges of graphene using scanning probe techniques.
Related Concept Videos
Overview of Microscopy Techniques
Atomic Force Microscopy
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

