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Related Experiment Video

Updated: Jun 7, 2026

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities

Published on: July 24, 2015

Nanoanalysis of graphene layers using scanning probe techniques.

M R Connolly¹, C G Smith

¹Cavendish Laboratory, Department of Physics, University of Cambridge, Cambridge CB3 0HE, UK. mrc61@cam.ac.uk

Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences

|November 3, 2010

Summary

Scanning probe techniques offer direct electrical access to graphene's surface states. This review highlights recent nanoanalytic advances for studying graphene surfaces and edges.

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Area of Science:

Materials Science
Condensed Matter Physics
Nanotechnology

Background:

Graphene is an ideal two-dimensional system with electron wave functions close to its environment.
This proximity presents challenges for surface passivation while maintaining electron mobility.
It also enables direct electrical probing of 2D surface states via scanning probe methods.

Purpose of the Study:

To review recent advancements in the nanoanalysis of graphene.
Focus on utilizing scanning probe techniques for surface and edge characterization.

Main Methods:

Application of scanning probe techniques for nanoanalysis.
Investigating electrical properties of graphene surfaces and edges.

Main Results:

Demonstration of direct electrical access to graphene's 2D surface states.
Highlighting successful nanoanalytic studies of graphene surfaces and edges.

Conclusions:

Scanning probe techniques are crucial for understanding graphene's unique properties.
Continued research in nanoanalytics will further elucidate graphene's surface and edge behavior.