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Single-Gaussian-beam interaction with a dielectric microsphere: radiation forces, multiple internal reflections, and

C Saloma, M O Cambaliza

|November 6, 2010

Summary

Radiation forces from internal reflections in dielectric microspheres are analyzed. Higher-order reflections significantly impact forces for positive index mismatch, but are negligible for negative mismatch.

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Area of Science:

Optics
Photonics
Computational Physics

Background:

Dielectric microspheres are crucial in optical trapping and sensing.
Understanding radiation forces is key to manipulating microparticles.
Internal reflections within microspheres can significantly alter optical forces.

Purpose of the Study:

To analyze radiation forces generated by internal reflections in a dielectric microsphere.
To investigate the influence of index mismatch on these forces.
To profile caustic structures resulting from internal reflections.

Main Methods:

Utilized Euler transformation for rapid computation of axial-force vectors.
Calculated net force by averaging s- and p-polarized electric field components.

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Analyzed force characteristics for varying index mismatch (Δn).

Main Results:

Force characteristics strongly depend on the index mismatch (Δn).
Second and third internal reflections increased effective force by at least 10% for Δn = 0.65 and 0.32.
For Δn < 0, forces from reflections beyond the first were negligible (over 4 orders of magnitude smaller).
Caustic structures were profiled for Δn = ±0.32.

Conclusions:

Internal reflections play a critical role in radiation force generation, especially for positive index mismatch.
The Euler transformation provides an efficient method for calculating these forces.
The study highlights the importance of considering higher-order reflections for accurate optical force modeling.