Correlation between optical and topographical images from an external reflection near-field microscope with shear...

Area of Science:

• Optics
• Microscopy
• Surface Science

Background:

• Scanning near-field optical microscopy (SNOM) offers high-resolution imaging.
• Controlling tip-surface distance is crucial for SNOM stability and image quality.
• Shear force microscopy is a common technique for distance regulation.

Purpose of the Study:

• To describe an external reflection scanning near-field optical microscope.
• To compare near-field optical and shear force topographical images.
• To demonstrate the extraction of additional information from optical images.

Main Methods:

• Development of an external reflection scanning near-field optical microscope.
• Integration of shear force regulation for tip-surface distance control.
• Comparative imaging of various samples using optical and topographical modes.

Main Results:

• Near-field optical and shear force topographical images were successfully acquired and compared.
• Key correlative relationships between optical and topographical images were identified through symmetry considerations.
• Additional information was extracted from optical images, particularly demonstrated on human blood cells.

Conclusions:

• The described SNOM with shear force regulation provides a robust platform for correlative imaging.
• Symmetry analysis is a powerful tool for interpreting SNOM and topographical data.
• This technique enhances the potential for detailed analysis of biological and material samples.