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Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Electron Orbital Model01:18

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Orbitals are the areas outside of the atomic nucleus where electrons are most likely to reside. They are characterized by different energy levels, shapes, and three-dimensional orientations. The location of electrons is described most generally by a shell or principal energy level, then by a subshell within each shell, and finally, by individual orbitals found within the subshells.The first shell is closest to the nucleus, and it has only one subshell with a single spherical orbital called the...
Mass Analyzers: Common Types01:19

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The quadrupole mass analyzer consists of four cylindrical metal rods arranged in a diamond carrying a DC voltage and a radio-frequency AC voltage. The motion of ions through the quadrupole depends on the field strength, causing only ions of a certain m/z to resonate successfully and strike the detector at a given field strength. Though the transmission rate for these analyzers is high, the exact elemental composition of the sample is not determined because of low resolution; however, they are...
Electron Behavior00:54

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Electrons are negatively charged subatomic particles that are attracted to an orbit around the positively-charged nucleus of an atom. They reside in locations that are associated with energy levels called shells and are further organized into sub-shells and orbitals within each shell.Electrons Orbit the NucleusElectrons are found in specific locations outside of the nucleus. The shell in which an electron resides indicates the general energy level of the electron: those closer to the nucleus...
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The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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Related Experiment Video

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Experimental Methods for Trapping Ions Using Microfabricated Surface Ion Traps
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Published on: August 17, 2017

Electron-trapping materials and electron-beam-addressed electron-trapping material devices: an improved model.

Z Wen, N H Farhat

    Applied Optics
    |November 6, 2010
    PubMed
    Summary
    This summary is machine-generated.

    A new model enhances understanding of electron-trapping materials (ETMs) under blue and IR light. It improves optoelectronic neurocomputing by accounting for trap saturation and efficiency dependence, validated by experiments.

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    Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

    Published on: May 10, 2021

    Area of Science:

    • Optoelectronics
    • Materials Science
    • Neurocomputing

    Background:

    • Electron-trapping materials (ETMs) are crucial for optoelectronic devices.
    • Existing models do not fully capture ETM dynamics under complex light conditions.
    • Accurate modeling is essential for advanced applications like neurocomputing.

    Purpose of the Study:

    • To develop an improved model for electron-trapping material dynamics under simultaneous blue and IR light.
    • To incorporate previously neglected factors: electron-trap-density saturation and trapping efficiency dependence on existing trapped-electron density.
    • To explore electron-beam addressing of ETMs and develop a general design equation.

    Main Methods:

    • Development of a new theoretical model for ETM dynamics.
    • Inclusion of electron-trap-density saturation and trapping efficiency dependence.
    • Experimental verification of the proposed model.
    • Analysis of electron-beam addressing principles for ETM devices.

    Main Results:

    • The improved model accurately describes ETM behavior under dual-light illumination.
    • Electron-trap-density saturation and efficiency dependence are shown to be critical factors.
    • A general design equation for electron-beam-addressed ETM devices was derived.
    • Two specific devices, a spatial light modulator and an image intensifier, were presented.

    Conclusions:

    • The new model provides vital insights for optimizing ETMs in optoelectronic neurocomputing.
    • Electron-beam addressing offers a versatile method for controlling ETM devices.
    • The developed model and design equation facilitate the creation of advanced ETM-based technologies.