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Updated: Jun 7, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Abstract:
A model in geometric optics, along with some preliminary experimental results for a new range-finding method that exploits near-field diffraction phenomena found with plane gratings, is presented. Among the characteristics investigated is a magnification effect applicable to three-dimensional microscopy. A variety of embodiments of the method is disclosed, including an off-axis illumination model and a method of near-field focus compensation that takes advantage of the Scheimpflug condition.
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