Phase-shifting real-time holographic interferometry that uses bismuth silicon oxide crystals

A bismuth silicon oxide crystal is used in the diffusion regime as a dynamic recording medium in a real-time holographic interferometer based on anisotropic self-diffraction. This device is connected with an interferogram-analysis method that uses the phase-shifting technique for quantitative measurement of diffusive-reflecting object deformations. In addition to the usual error sources in phase shifting, the temporal interferogram erasure is studied and is found weakly perturbative for the measured phase. It is shown that quantitative measurements are possible for low-intensity object beams (8 µW/cm(2)) and a large observed area. Apractical situation of defect monitoring in a composite structure is presented.