Sample Preparation for Analysis: Overview
Sample Preparation for Analysis: Advanced Techniques
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Updated: Jun 6, 2026

Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
Published on: September 13, 2020
R Lucena1, B M Simonet, S Cárdenas
1Department of Analytical Chemistry, University of Córdoba, E-14071 Córdoba, Spain.
This study overviews how nanoparticles enhance sample preparation methods like solid phase extraction and filtration. Various nanoparticle types, including carbon, metallic, silica, and imprinted polymers, are discussed for diverse applications.
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